Indium oxide Silicon carbide 2H SiC 13C Ion beam analysis Pulsed laser deposition 18O Topological insulators Silica Defects 17Opp EPR Magnetic anisotropy Nickel AC susceptibility XPS Nanostructures PIXE Isotopic Tracing Adsorption Evaluation 7550Pp Nitridation Energy loss Alloys Growth 3C-SiC AFM 7550Ee NRP 17Op 17O Silicon Nuclear resonance profiling NRP Magnetic semiconductors Measurement Low energy electron diffraction LEED 27Ald p&α Alloy 15N Acoustic propreties of solid Interface defects Periodic multilayer Adsorption Isotherms GaMnAs Nanoparticles Pb centers Magnetization curves 6855Jk Oxidation Nuclear reaction analysis Multilayer Thin films Diffusion Gold Al2O3 Adsorbed layers ALD Capillary condensation Atomic Layer Deposition ALD Epitaxy Sputtering 27Aldp Silicon Carbide Auger electron spectroscopy AES Ferromagnetic resonance Charge exchange Zinc oxide Ion implantation X-ray diffraction Aluminum 7630Lh Kossel diffraction Raman spectroscopy Transparent conductive oxide TCO Acoustic HfO2 Epitaxial growth Oxygen deficiency Passivation Ageing Channeling XRD Stable isotopic tracing Rutherford backscattering spectrometry RBS Gallium oxide Thin film Density functional theory RBS 27Alda ADSORPTION DESORPTION HYSTERESIS 18O resonance Topological defects Metal-insulator transition Photoluminescence 8140Ef Annealing Hysteresis Aluminium