<?xml version="1.0" encoding="utf-8"?>
<TEI xmlns="http://www.tei-c.org/ns/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:hal="http://hal.archives-ouvertes.fr/" xmlns:gml="http://www.opengis.net/gml/3.3/" xmlns:gmlce="http://www.opengis.net/gml/3.3/ce" version="1.1" xsi:schemaLocation="http://www.tei-c.org/ns/1.0 http://api.archives-ouvertes.fr/documents/aofr-sword.xsd">
  <teiHeader>
    <fileDesc>
      <titleStmt>
        <title>HAL TEI export of hal-00668686</title>
      </titleStmt>
      <publicationStmt>
        <distributor>CCSD</distributor>
        <availability status="restricted">
          <licence target="https://creativecommons.org/publicdomain/zero/1.0/">CC0 1.0 - Universal</licence>
        </availability>
        <date when="2026-05-03T09:50:16+02:00"/>
      </publicationStmt>
      <sourceDesc>
        <p part="N">HAL API Platform</p>
      </sourceDesc>
    </fileDesc>
  </teiHeader>
  <text>
    <body>
      <listBibl>
        <biblFull>
          <titleStmt>
            <title xml:lang="en">Using perturbation FEM compute the IC interconnect parasitic capacitances considering process variation</title>
            <author role="aut">
              <persName>
                <forename type="first">Hui</forename>
                <surname>Qu</surname>
              </persName>
              <idno type="halauthorid">549673-0</idno>
              <affiliation ref="#struct-50102"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Xiaoyu</forename>
                <surname>Xu</surname>
              </persName>
              <idno type="halauthorid">565992-0</idno>
              <affiliation ref="#struct-50102"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Zhuoxiang</forename>
                <surname>Ren</surname>
              </persName>
              <email type="md5">31c83d137cfaadd80b23710b44765420</email>
              <email type="domain">upmc.fr</email>
              <idno type="idhal" notation="string">417917</idno>
              <idno type="idhal" notation="numeric">977337</idno>
              <idno type="halauthorid" notation="string">1002326-977337</idno>
              <idno type="ORCID">https://orcid.org/0000-0003-4700-8969</idno>
              <idno type="IDREF">https://www.idref.fr/079712193</idno>
              <idno type="RESEARCHERID">http://www.researcherid.com/rid/DNX-7374-2022</idno>
              <idno type="VIAF">https://viaf.org/viaf/213099127</idno>
              <idno type="RESEARCHERID">http://www.researcherid.com/rid/http://www.researcherid.com/rid/DNX-7374-2022</idno>
              <affiliation ref="#struct-57171"/>
            </author>
            <editor role="depositor">
              <persName>
                <forename>Pascal</forename>
                <surname>Gomez</surname>
              </persName>
              <email type="md5">e45f841e5c48d00149c93959db8b5ff8</email>
              <email type="domain">upmc.fr</email>
            </editor>
          </titleStmt>
          <editionStmt>
            <edition n="v1" type="current">
              <date type="whenSubmitted">2012-02-10 10:53:38</date>
              <date type="whenModified">2024-03-26 16:24:04</date>
              <date type="whenReleased">2012-02-10 10:53:38</date>
              <date type="whenProduced">2011-06-24</date>
            </edition>
            <respStmt>
              <resp>contributor</resp>
              <name key="160236">
                <persName>
                  <forename>Pascal</forename>
                  <surname>Gomez</surname>
                </persName>
                <email type="md5">e45f841e5c48d00149c93959db8b5ff8</email>
                <email type="domain">upmc.fr</email>
              </name>
            </respStmt>
          </editionStmt>
          <publicationStmt>
            <distributor>CCSD</distributor>
            <idno type="halId">hal-00668686</idno>
            <idno type="halUri">https://hal.sorbonne-universite.fr/hal-00668686</idno>
            <idno type="halBibtex">qu:hal-00668686</idno>
            <idno type="halRefHtml">&lt;i&gt;Conference AMT 2011&lt;/i&gt;, Jun 2011, Nanchang, China. pp.303 - 309</idno>
            <idno type="halRef">Conference AMT 2011, Jun 2011, Nanchang, China. pp.303 - 309</idno>
            <availability status="restricted"/>
          </publicationStmt>
          <seriesStmt>
            <idno type="stamp" n="UPMC" corresp="SORBONNE-UNIVERSITE">Université Pierre et Marie Curie</idno>
            <idno type="stamp" n="SORBONNE-UNIVERSITE">Sorbonne Université</idno>
            <idno type="stamp" n="ALLIANCE-SU"> Alliance Sorbonne Université</idno>
          </seriesStmt>
          <notesStmt>
            <note type="audience" n="2">International</note>
            <note type="invited" n="0">No</note>
            <note type="popular" n="0">No</note>
            <note type="peer" n="1">Yes</note>
            <note type="proceedings" n="1">Yes</note>
          </notesStmt>
          <sourceDesc>
            <biblStruct>
              <analytic>
                <title xml:lang="en">Using perturbation FEM compute the IC interconnect parasitic capacitances considering process variation</title>
                <author role="aut">
                  <persName>
                    <forename type="first">Hui</forename>
                    <surname>Qu</surname>
                  </persName>
                  <idno type="halauthorid">549673-0</idno>
                  <affiliation ref="#struct-50102"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Xiaoyu</forename>
                    <surname>Xu</surname>
                  </persName>
                  <idno type="halauthorid">565992-0</idno>
                  <affiliation ref="#struct-50102"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Zhuoxiang</forename>
                    <surname>Ren</surname>
                  </persName>
                  <email type="md5">31c83d137cfaadd80b23710b44765420</email>
                  <email type="domain">upmc.fr</email>
                  <idno type="idhal" notation="string">417917</idno>
                  <idno type="idhal" notation="numeric">977337</idno>
                  <idno type="halauthorid" notation="string">1002326-977337</idno>
                  <idno type="ORCID">https://orcid.org/0000-0003-4700-8969</idno>
                  <idno type="IDREF">https://www.idref.fr/079712193</idno>
                  <idno type="RESEARCHERID">http://www.researcherid.com/rid/DNX-7374-2022</idno>
                  <idno type="VIAF">https://viaf.org/viaf/213099127</idno>
                  <idno type="RESEARCHERID">http://www.researcherid.com/rid/http://www.researcherid.com/rid/DNX-7374-2022</idno>
                  <affiliation ref="#struct-57171"/>
                </author>
              </analytic>
              <monogr>
                <title level="m">2nd International Conference on Advanced Measurement and Test</title>
                <meeting>
                  <title>Conference AMT 2011</title>
                  <date type="start">2011-06-24</date>
                  <date type="end">2011-06-26</date>
                  <settlement>Nanchang</settlement>
                  <country key="CN">China</country>
                </meeting>
                <imprint>
                  <biblScope unit="volume">301 - 303</biblScope>
                  <biblScope unit="pp">303 - 309</biblScope>
                  <date type="datePub">2011-07-11</date>
                </imprint>
              </monogr>
            </biblStruct>
          </sourceDesc>
          <profileDesc>
            <langUsage>
              <language ident="en">English</language>
            </langUsage>
            <textClass>
              <keywords scheme="author">
                <term xml:lang="en">Integrated Circuit (IC) Parasitic Extraction</term>
                <term xml:lang="en">Perturbation FEM</term>
                <term xml:lang="en">Process Variation</term>
              </keywords>
              <classCode scheme="halDomain" n="spi.tron">Engineering Sciences [physics]/Electronics</classCode>
              <classCode scheme="halTypology" n="COMM">Conference papers</classCode>
              <classCode scheme="halOldTypology" n="COMM">Conference papers</classCode>
              <classCode scheme="halTreeTypology" n="COMM">Conference papers</classCode>
            </textClass>
            <abstract xml:lang="en">
              <p>In present IC design, the process variation such as the litho distortion has made the accurate extraction of parasitic capacitances of interconnects become more difficult. One of the problems is the generation of some small deformation including small angle, which makes it difficult to mesh generation when using 3D FEM solver, and the scale of the equation becomes larger. This paper uses the FEM with the perturbation to deal with the issue. We first build the matrix equation with the nominal geometry parameters, and then add the perturbation terms by using the derivative of the matrix and the dimension changes of the distorted conductors. The pertubated system equation is then solved to get the capacitances. The result shows that the method provides accurate capacitances with less CPU time and memory.</p>
            </abstract>
          </profileDesc>
        </biblFull>
      </listBibl>
    </body>
    <back>
      <listOrg type="structures">
        <org type="laboratory" xml:id="struct-50102" status="VALID">
          <orgName>Institute of Electrical Engineering</orgName>
          <desc>
            <address>
              <addrLine>Zhongguancun, Haidian Beijing 100080</addrLine>
              <country key="CN"/>
            </address>
          </desc>
          <listRelation>
            <relation active="#struct-239582" type="direct"/>
          </listRelation>
        </org>
        <org type="laboratory" xml:id="struct-57171" status="OLD">
          <idno type="RNSR">200919194D</idno>
          <orgName>Laboratoire d'Electronique et Electromagnétisme</orgName>
          <orgName type="acronym">L2E</orgName>
          <date type="end">2017-12-31</date>
          <desc>
            <address>
              <addrLine>UPMC Univ Paris 06, UR2, L2E Campus Jussieu Ailes 65-66, 1er et 2ème étages 75252 Paris CEDEX 05</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.l2e.upmc.fr</ref>
          </desc>
          <listRelation>
            <relation name="EA2385" active="#struct-93591" type="direct"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-239582" status="VALID">
          <idno type="ROR">https://ror.org/034t30j35</idno>
          <orgName>Chinese Academy of Sciences [Changchun Branch]</orgName>
          <orgName type="acronym">CAS</orgName>
          <desc>
            <address>
              <addrLine>52 Sanlihe Rd. - Xicheng District - Beijing, China 100864</addrLine>
              <country key="CN"/>
            </address>
            <ref type="url">http://english.cas.cn/</ref>
          </desc>
        </org>
        <org type="institution" xml:id="struct-93591" status="OLD">
          <idno type="ROR">https://ror.org/02en5vm52</idno>
          <orgName>Université Pierre et Marie Curie - Paris 6</orgName>
          <orgName type="acronym">UPMC</orgName>
          <date type="end">2017-12-31</date>
          <desc>
            <address>
              <addrLine>4 place Jussieu - 75005 Paris</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.upmc.fr/</ref>
          </desc>
        </org>
      </listOrg>
    </back>
  </text>
</TEI>