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Multilayer silicene: clear evidence of Ag-terminated bulk silicon

Abstract : The existence of silicite, a new allotrope of silicon based on a stacking of hexagonal silicene planes is one of the most discussed topic in the field of 2D materials. Using grazing incidence X-ray diffraction (GIXD), we have followed in situ the growth of Si films on Ag(111) in the low temperature growth regime (510-520 K). GIXD experiments demonstrate that Si films have a diamond-like structure, with an averaged lattice constant slightly different from bulk Si. The diffracted intensities associated with the Si films are well reproduced by the Ag/Si(111) (sqrt(3)xsqrt(3))R30° honeycomb chain model, whereas models with Ag-free Si surfaces fail to reproduce the experimental data.
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Submitted on : Tuesday, April 11, 2017 - 3:18:11 PM
Last modification on : Sunday, February 6, 2022 - 8:56:02 PM
Long-term archiving on: : Wednesday, July 12, 2017 - 1:28:37 PM

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Alberto Curcella, Romain Bernard, Yves Borensztein, Michele Lazzeri, Andrea Resta, et al.. Multilayer silicene: clear evidence of Ag-terminated bulk silicon. 2D Materials, IOP Publishing, 2017, 4, pp.25067 - 25067. ⟨10.1088/2053-1583/aa65b8⟩. ⟨hal-01505617⟩

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