Multilayer silicene: clear evidence of Ag-terminated bulk silicon

Abstract : The existence of silicite, a new allotrope of silicon based on a stacking of hexagonal silicene planes is one of the most discussed topic in the field of 2D materials. Using grazing incidence X-ray diffraction (GIXD), we have followed in situ the growth of Si films on Ag(111) in the low temperature growth regime (510-520 K). GIXD experiments demonstrate that Si films have a diamond-like structure, with an averaged lattice constant slightly different from bulk Si. The diffracted intensities associated with the Si films are well reproduced by the Ag/Si(111) (sqrt(3)xsqrt(3))R30° honeycomb chain model, whereas models with Ag-free Si surfaces fail to reproduce the experimental data.
Complete list of metadatas

Cited literature [39 references]  Display  Hide  Download

https://hal.sorbonne-universite.fr/hal-01505617
Contributor : Geoffroy Prévot <>
Submitted on : Tuesday, April 11, 2017 - 3:18:11 PM
Last modification on : Friday, May 24, 2019 - 5:29:35 PM
Long-term archiving on : Wednesday, July 12, 2017 - 1:28:37 PM

Files

MultilayerSiliceneGIXD-v9.pdf
Files produced by the author(s)

Identifiers

Citation

Alberto Curcella, Romain Bernard, Yves Borensztein, Michele Lazzeri, Andrea Resta, et al.. Multilayer silicene: clear evidence of Ag-terminated bulk silicon. 2D Materials, IOP Publishing, 2017, 4, pp.25067 - 25067. ⟨10.1088/2053-1583/aa65b8⟩. ⟨hal-01505617⟩

Share

Metrics

Record views

758

Files downloads

330