Atomic force microscope tip localization and tracking through deep learning based vision inside an electron microscope - Sorbonne Université
Conference Papers Year : 2019

Atomic force microscope tip localization and tracking through deep learning based vision inside an electron microscope

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Catherine ACHARD  : Connect in order to contact the contributor

https://hal.sorbonne-universite.fr/hal-02477481

Submitted on : Thursday, February 13, 2020-1:59:27 PM

Last modification on : Thursday, March 28, 2024-2:26:03 PM

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hal-02477481 , version 1 (13-02-2020)

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Shuai Liang, Mokrane Boudaoud, Catherine Achard, Weibin Rong, Stéphane Régnier. Atomic force microscope tip localization and tracking through deep learning based vision inside an electron microscope. 2019 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS), Nov 2019, Macau, France. pp.2435-2440, ⟨10.1109/IROS40897.2019.8968567⟩. ⟨hal-02477481⟩

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