Article Dans Une Revue Surface and Interface Analysis Année : 1988

EXAFS study of passive films on Ni and NiMo alloy electrodes

Résumé

The specular reflectivity of x‐rays at sufficiently small grazing angles is absorption‐coefficient‐dependent so that the EXAFS technique can be used to probe the surface. This method allows in situ measurements. Applications to the study of passive films on nickel and nickel‐molybdenum alloy electrodes are presented. In both cases, the passive films is found to be composed of NiO entities probably ordered perpendicularly to the electrode. Molybdenum enrichment in the surface layer is confirmed by an increase of the Mo k edge signal.

Domaines

Chimie

Dates et versions

hal-04625546 , version 1 (26-06-2024)

Identifiants

Citer

Louis Bosio, Robert Cortès, P. Delichère, Michel Froment, Suzanne Joiret. EXAFS study of passive films on Ni and NiMo alloy electrodes. Surface and Interface Analysis, 1988, 12 (7), pp.380-384. ⟨10.1002/sia.740120703⟩. ⟨hal-04625546⟩
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