Article Dans Une Revue Physics Letters A Année : 1986

X-ray absorption spectroscopy in dispersive mode and by total reflection

Résumé

The association of the total reflection scheme with the dispersive mode allows one to record in short time the EXAFS and XANES spectra of the first 30 Å of a surface. In situ time resolved observations of the surface modifications under chemical or electrochemical treatments are thus accessible. This promising technique is illustrated through two examples: (i) the thermal oxidation of a metallic copper surface and (ii) the electrochemical inclusion of Cu+ ions within a 5000 Å organic conducting polymer (poly-3-methylthiophene) electrochemically deposited on a platinum surface.

Domaines

Chimie

Dates et versions

hal-04651344 , version 1 (17-07-2024)

Identifiants

Citer

E. Dartyge, A. Fontaine, G. Tourillon, Robert Cortès, A. Jucha. X-ray absorption spectroscopy in dispersive mode and by total reflection. Physics Letters A, 1986, 113 (7), pp.384-388. ⟨10.1016/0375-9601(86)90051-4⟩. ⟨hal-04651344⟩
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