Determination of the diffusion coefficient of protons in Nafion thin films by ac-electrogravimetry. - Sorbonne Université Access content directly
Journal Articles Langmuir Year : 2013

Determination of the diffusion coefficient of protons in Nafion thin films by ac-electrogravimetry.

Abstract

This letter deals with an adaptation of the ac-electrogravimetry technique to extract separately the dynamic properties of H(+) and water in Nafion nanometric thin films (average thickness of 400 nm). An original theoretical approach was developed to extract the representative parameters from ac-electrogravimetry data. The concentration change of the exchanged species and the diffusion coefficient of the protons in a Nafion nanometric thin film (D = 0.5 × 10(-6) cm(2) s(-1) at 0.3 V vs SCE) were estimated for the first time according to the applied potential. The conductivity value of Nafion thin films was calculated from the Nernst-Einstein equation using diffusion coefficients and concentration values extracted from ac-electrogravimetry data. The calculated conductivity results agree well with the experimental proton conductivity values of Nafion thin films.
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Dates and versions

hal-00935182 , version 1 (23-01-2014)

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Ozlem Sel, Loan To Thi Kim, Catherine Debiemme-Chouvy, Claude Gabrielli, Christel Laberty-Robert, et al.. Determination of the diffusion coefficient of protons in Nafion thin films by ac-electrogravimetry.. Langmuir, 2013, 29 (45), pp.13655-13660. ⟨10.1021/la401453e⟩. ⟨hal-00935182⟩
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