Skip to Main content Skip to Navigation
Journal articles

Determination of the diffusion coefficient of protons in Nafion thin films by ac-electrogravimetry.

Abstract : This letter deals with an adaptation of the ac-electrogravimetry technique to extract separately the dynamic properties of H(+) and water in Nafion nanometric thin films (average thickness of 400 nm). An original theoretical approach was developed to extract the representative parameters from ac-electrogravimetry data. The concentration change of the exchanged species and the diffusion coefficient of the protons in a Nafion nanometric thin film (D = 0.5 × 10(-6) cm(2) s(-1) at 0.3 V vs SCE) were estimated for the first time according to the applied potential. The conductivity value of Nafion thin films was calculated from the Nernst-Einstein equation using diffusion coefficients and concentration values extracted from ac-electrogravimetry data. The calculated conductivity results agree well with the experimental proton conductivity values of Nafion thin films.
Document type :
Journal articles
Complete list of metadatas

https://hal.sorbonne-universite.fr/hal-00935182
Contributor : Véronique Martin <>
Submitted on : Thursday, January 23, 2014 - 11:12:26 AM
Last modification on : Thursday, October 1, 2020 - 2:02:02 PM

Identifiers

Citation

Ozlem Sel, Loan To Thi Kim, Catherine Debiemme-Chouvy, Claude Gabrielli, Christel Laberty-Robert, et al.. Determination of the diffusion coefficient of protons in Nafion thin films by ac-electrogravimetry.. Langmuir, American Chemical Society, 2013, 29 (45), pp.13655-13660. ⟨10.1021/la401453e⟩. ⟨hal-00935182⟩

Share

Metrics

Record views

621