Temperature and field dependent magnetization in a sub-µm patterned Co/FeRh film studied by resonant x-ray scattering
Résumé
We studied the temperature and field dependence of the magnetization in a Co/FeRh/MgO(001) film patterned into a matrix of sub-µm sized rectangles, using element selective resonant scattering of polarized soft x-rays. We show that it is possible to reverse partially the magnetization of the Co layer in a thermal cycle that crosses the FeRh antiferromagnetic to ferromagnetic transition. Our results support the interest of patterned Co/FeRh films and their potential for achieving temperature induced magnetization switching.
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