Temperature and field dependent magnetization in a sub-µm patterned Co/FeRh film studied by resonant x-ray scattering - Sorbonne Université Access content directly
Journal Articles Journal of Physics D: Applied Physics Year : 2016

Temperature and field dependent magnetization in a sub-µm patterned Co/FeRh film studied by resonant x-ray scattering

Abstract

We studied the temperature and field dependence of the magnetization in a Co/FeRh/MgO(001) film patterned into a matrix of sub-µm sized rectangles, using element selective resonant scattering of polarized soft x-rays. We show that it is possible to reverse partially the magnetization of the Co layer in a thermal cycle that crosses the FeRh antiferromagnetic to ferromagnetic transition. Our results support the interest of patterned Co/FeRh films and their potential for achieving temperature induced magnetization switching.
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Dates and versions

hal-01323817 , version 1 (01-06-2016)

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Lounès Lounis, Carlo Spezzani, Renaud Delaunay, Franck Fortuna, Martin Obstbaum, et al.. Temperature and field dependent magnetization in a sub-µm patterned Co/FeRh film studied by resonant x-ray scattering. Journal of Physics D: Applied Physics, 2016, 49 (20), pp.205003. ⟨10.1088/0022-3727/49/20/205003⟩. ⟨hal-01323817⟩
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