Daisuke Fujimoto, Noriyuki Miura, Makoto Nagata, Yuichi Hayashi, Naofumi Homma, et al.. Power Noise Measurements of Cryptographic VLSI Circuits Regarding Side-Channel Information Leakage.
IEICE Transactions on Electronics, Institute of Electronics, Information and Communication Engineers, 2014, E97.C (4), pp. 272-279.
⟨hal-01540373⟩