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Journal Articles Electrochimica Acta Year : 2010

Determination of effective capacitance and film thickness from constant-phase-element parameters

Abstract

Two different mathematical formulas for estimating effective capacitance from Constant-Phase-Element (CPE) parameters, taken from the literature, are associated unambiguously with either surface or normal time-constant distributions. Application to different systems are used to illustrate the importance of using the correct formula that corresponds to a given type of distribution. Experiments and simulations are used to show that the effective capacitance obtained for a normal distribution yields correct values for the film thickness under conditions where the local resistivity does not vary significantly. When the local resistivity varies considerably over the thickness of a film, the experimental frequency range may preclude observation of the capacitance contribution of a portion of the film, resulting in under prediction of the film thickness.

Dates and versions

hal-04112212 , version 1 (31-05-2023)

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Bryan Hirschorn, Mark E Orazem, Bernard Tribollet, Vincent Vivier, Isabelle Frateur, et al.. Determination of effective capacitance and film thickness from constant-phase-element parameters. Electrochimica Acta, 2010, 55 (21), pp.6218-6227. ⟨10.1016/j.electacta.2009.10.065⟩. ⟨hal-04112212⟩
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