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Journal Articles IEEE Transactions on Instrumentation and Measurement Year : 1997

A New Optical Wavelength Ratio Measurement Apparatus: The Fringe Counting Sigmameter

Abstract

A new, compact and achromatic Michelson-type interferometer with a variable path difference is presented. This "fringe-counting" sigmameter allows measurement of optical wavelength ratios between a laser of unknown wavelength and a reference laser of known wavelength. This apparatus, maintained in a vacuum, measures interference order variations in two stages: integer counting of around 400 000 and fractional counting (also called "excess fraction") with an uncertainty of 10. From these measurements, this "sigmameter" can determine laser wavelength from 0.36 m to 1.5 m with an accuracy of 1.10 using a reference stabilized He-Ne laser.
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Dates and versions

hal-04421769 , version 1 (23-04-2024)

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Patrick P. Juncar, Hadj Elandaloussi, Marc E. Himbert, J. Pinard, Annick Razet. A New Optical Wavelength Ratio Measurement Apparatus: The Fringe Counting Sigmameter. IEEE Transactions on Instrumentation and Measurement, 1997, 46 (3), pp.690-695. ⟨10.1109/19.585433⟩. ⟨hal-04421769⟩
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