Extraction of IC interconnect parasitic capacitances using dual discrete geometric methods with prism elements - Sorbonne Université
Communication Dans Un Congrès Année : 2013

Extraction of IC interconnect parasitic capacitances using dual discrete geometric methods with prism elements

Fichier non déposé

Dates et versions

hal-00847656 , version 1 (24-07-2013)

Identifiants

  • HAL Id : hal-00847656 , version 1

Citer

Xiaoyu Xu, Zhuoxiang Ren. Extraction of IC interconnect parasitic capacitances using dual discrete geometric methods with prism elements. Conference EMF 2013, Apr 2013, Bruges, Belgium. ⟨hal-00847656⟩
58 Consultations
0 Téléchargements

Partager

More