Extraction of IC interconnect parasitic capacitances using dual discrete geometric methods with prism elements - Sorbonne Université
Conference Papers Year : 2013

Extraction of IC interconnect parasitic capacitances using dual discrete geometric methods with prism elements

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hal-00847656 , version 1 (24-07-2013)

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  • HAL Id : hal-00847656 , version 1

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Xiaoyu Xu, Zhuoxiang Ren. Extraction of IC interconnect parasitic capacitances using dual discrete geometric methods with prism elements. Conference EMF 2013, Apr 2013, Bruges, Belgium. ⟨hal-00847656⟩
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