Extraction of IC interconnect parasitic capacitances using dual discrete geometric methods with prism elements - Sorbonne Université
Conference Papers Year : 2013

Extraction of IC interconnect parasitic capacitances using dual discrete geometric methods with prism elements

Xiaoyu Xu
  • Function : Author
Institute of Electrical Engineering
Zhuoxiang Ren
Laboratoire d'Electronique et Electromagnétisme
CV

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Electromagnetism

Pascal Gomez  : Connect in order to contact the contributor

https://hal.sorbonne-universite.fr/hal-00847656

Submitted on : Wednesday, July 24, 2013-10:33:56 AM

Last modification on : Tuesday, March 26, 2024-4:24:04 PM

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hal-00847656 , version 1 (24-07-2013)

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  • HAL Id : hal-00847656 , version 1

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Xiaoyu Xu, Zhuoxiang Ren. Extraction of IC interconnect parasitic capacitances using dual discrete geometric methods with prism elements. Conference EMF 2013, Apr 2013, Bruges, Belgium. ⟨hal-00847656⟩

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