Boundary Condition in Liquid Thin Films Revealed through the Thermal Fluctuations of Their Free Surfaces - Sorbonne Université Access content directly
Journal Articles Physical Review Letters Year : 2015

Boundary Condition in Liquid Thin Films Revealed through the Thermal Fluctuations of Their Free Surfaces

Abstract

We investigate the properties of nanometric liquid films with a new non invasive technique. We measure the spontaneous thermal fluctuations of the free surfaces of liquids to probe their hydrodynamic boundary condition at a solid wall. The surface fluctuations of a silicon oil film could be described with a no-slip boundary condition for film thicknesses down to 20 nm. Oppositely, a 4 nm negative slip length had to be introduced to describe the behavior of n-hexadecane, consistently with previous Surface Force Apparatus data on the same system. Our results demonstrate that at vanishing flow a nanometric solid-like layer close to the wall may exist according to the nature of the liquid.
Fichier principal
Vignette du fichier
Pottier_2015_Boundary_Condition.pdf (369.46 Ko) Télécharger le fichier
Origin : Files produced by the author(s)
Loading...

Dates and versions

hal-01176182 , version 1 (15-07-2015)

Identifiers

Cite

B Pottier, Christian Frétigny, L Talini. Boundary Condition in Liquid Thin Films Revealed through the Thermal Fluctuations of Their Free Surfaces. Physical Review Letters, 2015, 114 (22), pp.227801. ⟨10.1103/PhysRevLett.114.227801⟩. ⟨hal-01176182⟩
145 View
334 Download

Altmetric

Share

Gmail Facebook X LinkedIn More