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Journal Articles Optics Express Year : 2016

Near-field to far-field characterization of speckle patterns generated by disordered nanomaterials

Abstract

We study the intensity spatial correlation function of optical speckle patterns above a disordered dielectric medium in the multiple scattering regime. The intensity distributions are recorded by scanning near-field optical microscopy (SNOM) with sub-wavelength spatial resolution at variable distances from the surface in a range which spans continuously from the near-field (distance ≪λ) to the far-field regime (distance ≫λ). The non-universal behavior at sub-wavelength distances reveals the connection between the near-field speckle pattern and the internal structure of the medium.
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Dates and versions

hal-01310732 , version 1 (16-03-2024)

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Valentina Parigi, Elodie Perros, Guillaume Binard, Céline Bourdillon, Agnès Maître, et al.. Near-field to far-field characterization of speckle patterns generated by disordered nanomaterials. Optics Express, 2016, 24 (7), pp.7019-7027. ⟨10.1364/OE.24.007019⟩. ⟨hal-01310732⟩
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