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Conference Papers Year : 2017

Approximate Stochastic Model of Geometry Randomness on Interconnect Parasitic in VLSI Circuit

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Electromagnetism

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https://hal.sorbonne-universite.fr/hal-01806194

Submitted on : Friday, June 1, 2018-4:55:43 PM

Last modification on : Thursday, February 15, 2024-4:21:29 PM

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hal-01806194 , version 1 (01-06-2018)

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  • HAL Id : hal-01806194 , version 1

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Ying Yin, Xiaoyu Xu, Pengfei Lyu, Shuai Yan, Zhuoxiang Ren. Approximate Stochastic Model of Geometry Randomness on Interconnect Parasitic in VLSI Circuit. Conference COMPUMAG 2017, Jun 2017, Deajeon, South Korea. ⟨hal-01806194⟩

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