Metrological Detection of Multipartite Entanglement from Young Diagrams - Sorbonne Université
Article Dans Une Revue Physical Review Letters Année : 2021

Metrological Detection of Multipartite Entanglement from Young Diagrams

Résumé

We characterize metrologically useful multipartite entanglement by representing partitions with Young diagrams. We derive entanglement witnesses that are sensitive to the shape of Young diagrams and show that Dyson's rank acts as a resource for quantum metrology. Common quantifiers, such as the entanglement depth and k-separability are contained in this approach as the diagram's width and height. Our methods are experimentally accessible in a wide range of atomic systems, as we illustrate by analyzing published data on the quantum Fisher information and spin-squeezing coefficients.
Fichier principal
Vignette du fichier
Ren et al. - 2021 - Metrological Detection of Multipartite Entanglemen.pdf (7.81 Mo) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)

Dates et versions

hal-03171031 , version 1 (16-03-2021)

Identifiants

Citer

Zhihong Ren, Weidong Li, Augusto Smerzi, Manuel Gessner. Metrological Detection of Multipartite Entanglement from Young Diagrams. Physical Review Letters, 2021, 126 (8), pp.080502. ⟨10.1103/PhysRevLett.126.080502⟩. ⟨hal-03171031⟩
102 Consultations
52 Téléchargements

Altmetric

Partager

More