Structural defects in YBaCuO thin films grown on MgO substrates
Abstract
YBaCuO thin films grown using the in situ laser ablation deposition technique, were studied using several complementary analyses : X-ray diffraction, RBS in channeling geometry and micro Raman spectrometry, in order to obtain complementary data on the crystalline quality of the films and on the nature of the intrinsic defects due to the growth process or induced by the RBS analysis.