In‐Situ Raman Spectroscopy Combined with X‐Ray Photoelectron Spectroscopy and Nuclear Microanalysis for Studies of Anodic Corrosion Film Formation on Fe‐Cr Single Crystals - Sorbonne Université
Article Dans Une Revue Journal of The Electrochemical Society Année : 1988

In‐Situ Raman Spectroscopy Combined with X‐Ray Photoelectron Spectroscopy and Nuclear Microanalysis for Studies of Anodic Corrosion Film Formation on Fe‐Cr Single Crystals

Résumé

The possible use of Raman spectroscopy for studies of anodic corrosion film formation on Fe‐Cr and Fe‐Cr‐Mo single crystals has been elucidated. The study shows that Raman spectra from passive films (thickness range 5–6 nm) and from "transpassive films" or films grown during secondary passivity (thickness range 5–25 nm) can be detected and interpreted. The results from Raman spectroscopy have been obtained in and combined with complementary results from x‐ray photoelectron spectroscopy and nuclear microanalysis. Identified phases in the passive film are and in the transpassive film , Fe‐Cr spinel, and amorphous .

Domaines

Chimie
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Dates et versions

hal-04625895 , version 1 (26-06-2024)

Identifiants

Citer

Dominique Thierry, D. Persson, C. Leygraf, D. Delichère, Suzanne Joiret, et al.. In‐Situ Raman Spectroscopy Combined with X‐Ray Photoelectron Spectroscopy and Nuclear Microanalysis for Studies of Anodic Corrosion Film Formation on Fe‐Cr Single Crystals. Journal of The Electrochemical Society, 1988, 135 (2), pp.305-310. ⟨10.1149/1.2095605⟩. ⟨hal-04625895⟩
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