Exafs from measurements of X-ray reflectivity on passivated electrodes - Sorbonne Université
Article Dans Une Revue Journal of electroanalytical chemistry and interfacial electrochemistry Année : 1984

Exafs from measurements of X-ray reflectivity on passivated electrodes

Résumé

Quite recently, it has been found that X-ray absorption spectroscopy may be used as a probe for passive films. We measured the reflectivity vs. the incident energy from bulk samples and now report the preliminary results obtained from in situ measurements on passivated nickel.

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Chimie

Véronique Martin  : Connectez-vous pour contacter le contributeur

https://hal.sorbonne-universite.fr/hal-04665571

Soumis le : mercredi 31 juillet 2024-13:54:57

Dernière modification le : vendredi 2 août 2024-03:27:25

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hal-04665571 , version 1 (31-07-2024)

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Louis Bosio, Robert Cortès, André Defrain, Michel Froment. Exafs from measurements of X-ray reflectivity on passivated electrodes. Journal of electroanalytical chemistry and interfacial electrochemistry, 1984, 180 (1-2), pp.265-271. ⟨10.1016/0368-1874(84)83585-6⟩. ⟨hal-04665571⟩

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