Exafs from measurements of X-ray reflectivity on passivated electrodes - Sorbonne Université
Journal Articles Journal of electroanalytical chemistry and interfacial electrochemistry Year : 1984

Exafs from measurements of X-ray reflectivity on passivated electrodes

Abstract

Quite recently, it has been found that X-ray absorption spectroscopy may be used as a probe for passive films. We measured the reflectivity vs. the incident energy from bulk samples and now report the preliminary results obtained from in situ measurements on passivated nickel.

Dates and versions

hal-04665571 , version 1 (31-07-2024)

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Cite

Louis Bosio, Robert Cortès, André Defrain, Michel Froment. Exafs from measurements of X-ray reflectivity on passivated electrodes. Journal of electroanalytical chemistry and interfacial electrochemistry, 1984, 180 (1-2), pp.265-271. ⟨10.1016/0368-1874(84)83585-6⟩. ⟨hal-04665571⟩
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