Exafs from measurements of X-ray reflectivity on passivated electrodes - Sorbonne Université
Journal Articles Journal of electroanalytical chemistry and interfacial electrochemistry Year : 1984

Exafs from measurements of X-ray reflectivity on passivated electrodes

Abstract

Quite recently, it has been found that X-ray absorption spectroscopy may be used as a probe for passive films. We measured the reflectivity vs. the incident energy from bulk samples and now report the preliminary results obtained from in situ measurements on passivated nickel.

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Chemical Sciences

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https://hal.sorbonne-universite.fr/hal-04665571

Submitted on : Wednesday, July 31, 2024-1:54:57 PM

Last modification on : Friday, August 2, 2024-3:27:25 AM

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hal-04665571 , version 1 (31-07-2024)

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Louis Bosio, Robert Cortès, André Defrain, Michel Froment. Exafs from measurements of X-ray reflectivity on passivated electrodes. Journal of electroanalytical chemistry and interfacial electrochemistry, 1984, 180 (1-2), pp.265-271. ⟨10.1016/0368-1874(84)83585-6⟩. ⟨hal-04665571⟩

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