Exafs from measurements of X-ray reflectivity on passivated electrodes - Sorbonne Université
Article Dans Une Revue Journal of electroanalytical chemistry and interfacial electrochemistry Année : 1984

Exafs from measurements of X-ray reflectivity on passivated electrodes

Résumé

Quite recently, it has been found that X-ray absorption spectroscopy may be used as a probe for passive films. We measured the reflectivity vs. the incident energy from bulk samples and now report the preliminary results obtained from in situ measurements on passivated nickel.

Domaines

Chimie

Dates et versions

hal-04665571 , version 1 (31-07-2024)

Identifiants

Citer

Louis Bosio, Robert Cortès, André Defrain, Michel Froment. Exafs from measurements of X-ray reflectivity on passivated electrodes. Journal of electroanalytical chemistry and interfacial electrochemistry, 1984, 180 (1-2), pp.265-271. ⟨10.1016/0368-1874(84)83585-6⟩. ⟨hal-04665571⟩
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