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Journal articles
Note: Observation of the angular distribution of an x-ray characteristic emission through a periodic multilayer
Philippe Jonnard
1
Meiyi Wu
1
Jean-Michel André
1
Karine Le Guen
1
Zhanshan Wang
2
Qiushi Huang
2
Ian Vickridge
3
Didier Schmaus
3, 4
Emrick Briand
3, 5, 6, 7
Sébastien Steydli
3
Philippe Walter
8
5
SAFIR - Système d'Analyse par Faisceaux d'Ions Rapides
INSP-E5 - Couches nanométriques : formation, interfaces, défauts
Philippe Jonnard 1
Author
Jean-Michel André 1
Author IdHAL : jean-michel-andre ORCID : https://orcid.org/0000-0003-3639-1691
Karine Le Guen 1
Author
Zhanshan Wang 2
Author
Qiushi Huang 2
Author
Ian Vickridge 3
Author IdHAL : ian-vickridge ORCID : https://orcid.org/0000-0002-1817-3378
Didier Schmaus 3, 4
Author
Emrick Briand 3, 5, 6, 7
Author IdHAL : emrick-briand
Sébastien Steydli 3
Author
Philippe Walter 8
Author IdHAL : philippe-walter ResearcherId : http://www.researcherid.com/rid/K-7722-2012 ORCID : https://orcid.org/0000-0002-1804-8374
1
LCPMR - Laboratoire de Chimie Physique - Matière et Rayonnement (11 Rue Pierre et Marie Curie 75231 Paris Cedex 05 - France)
- SU - Sorbonne Université (21 rue de l’École de médecine - 75006 Paris - France)
- CNRS - Centre National de la Recherche Scientifique : UMR7614 (France)
2
Tongji University (1239 Siping Road, Shanghai
- China)
3
INSP - Institut des Nanosciences de Paris (Sorbonne-Université, Case 840 4 place Jussieu 75252 Paris Cedex 05 - France)
- SU - Sorbonne Université (21 rue de l’École de médecine - 75006 Paris - France)
- CNRS - Centre National de la Recherche Scientifique : UMR7588 (France)
4
UPD7 - Université Paris Diderot - Paris 7 (5 rue Thomas-Mann - 75205 Paris cedex 13 - France)
5
SAFIR - Système d'Analyse par Faisceaux d'Ions Rapides (France)
- INSP-E5 - Couches nanométriques : formation, interfaces, défauts (France)
- INSP - Institut des Nanosciences de Paris (Sorbonne-Université, Case 840 4 place Jussieu 75252 Paris Cedex 05 - France)
- SU - Sorbonne Université (21 rue de l’École de médecine - 75006 Paris - France)
- CNRS - Centre National de la Recherche Scientifique : UMR7588 (France)
- INSP - Institut des Nanosciences de Paris (Sorbonne-Université, Case 840 4 place Jussieu 75252 Paris Cedex 05 - France)
6
INSP-E5 - Couches nanométriques : formation, interfaces, défauts (France)
- INSP - Institut des Nanosciences de Paris (Sorbonne-Université, Case 840 4 place Jussieu 75252 Paris Cedex 05 - France)
- SU - Sorbonne Université (21 rue de l’École de médecine - 75006 Paris - France)
- CNRS - Centre National de la Recherche Scientifique : UMR7588 (France)
7
SU - Sorbonne Université (21 rue de l’École de médecine - 75006 Paris - France)
8
LAMS - Laboratoire d'Archéologie Moléculaire et Structurale (Sorbonne-Université 4 Place Jussieu 75252 Paris Cedex 5 - France)
- SU - Sorbonne Université (21 rue de l’École de médecine - 75006 Paris - France)
- CNRS - Centre National de la Recherche Scientifique : UMR8220 (France)
Abstract : We present the observation of the angular distribution of a characteristic x-ray emission through a periodic multilayer. The emission coming from the substrate on which the multilayer is deposited is used for this purpose. It is generated upon proton irradiation through the multilayer and detected with an energy sensitive CCD camera. The observed distribution in the low detection angle range presents a clear dip at a position characteristic of the emitting element. Thus, such a device can be envisaged as a spectrometer without mechanical displacement and using various ionizing sources (electrons, x-rays, and ions), their incident direction being irrelevant.
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Journal articles
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https://hal.sorbonne-universite.fr/hal-01882729
Contributor : Gestionnaire Hal-Su <>
Submitted on : Thursday, September 27, 2018 - 12:52:16 PM
Last modification on : Monday, December 14, 2020 - 9:53:06 AM
Long-term archiving on: : Friday, December 28, 2018 - 2:50:00 PM
Contributor : Gestionnaire Hal-Su <>
Submitted on : Thursday, September 27, 2018 - 12:52:16 PM
Last modification on : Monday, December 14, 2020 - 9:53:06 AM
Long-term archiving on: : Friday, December 28, 2018 - 2:50:00 PM
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- HAL Id : hal-01882729, version 1
- DOI : 10.1063/1.5040980
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CNRS | ALLINSP | INC-CNRS | SORBONNE-UNIVERSITE | INSP | LAMS | LCPMR | UNIV-PARIS7 | USPC | SU-SCIENCES | UNIV-PARIS | INSP-E5 | SU-TI
Citation
Philippe Jonnard, Meiyi Wu, Jean-Michel André, Karine Le Guen, Zhanshan Wang, et al.. Note: Observation of the angular distribution of an x-ray characteristic emission through a periodic multilayer. Review of Scientific Instruments, American Institute of Physics, 2018, 89 (9), pp.096109. ⟨10.1063/1.5040980⟩. ⟨hal-01882729⟩
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