Note: Observation of the angular distribution of an x-ray characteristic emission through a periodic multilayer - Sorbonne Université
Article Dans Une Revue Review of Scientific Instruments Année : 2018

Note: Observation of the angular distribution of an x-ray characteristic emission through a periodic multilayer

Résumé

We present the observation of the angular distribution of a characteristic x-ray emission through a periodic multilayer. The emission coming from the substrate on which the multilayer is deposited is used for this purpose. It is generated upon proton irradiation through the multilayer and detected with an energy sensitive CCD camera. The observed distribution in the low detection angle range presents a clear dip at a position characteristic of the emitting element. Thus, such a device can be envisaged as a spectrometer without mechanical displacement and using various ionizing sources (electrons, x-rays, and ions), their incident direction being irrelevant.
Fichier principal
Vignette du fichier
RSI 89 096109 (2018)_sans marque.pdf (235.38 Ko) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)
Loading...

Dates et versions

hal-01882729 , version 1 (27-09-2018)

Identifiants

Citer

Philippe Jonnard, Meiyi Wu, Jean-Michel André, Karine Le Guen, Zhanshan Wang, et al.. Note: Observation of the angular distribution of an x-ray characteristic emission through a periodic multilayer. Review of Scientific Instruments, 2018, 89 (9), pp.096109. ⟨10.1063/1.5040980⟩. ⟨hal-01882729⟩
152 Consultations
139 Téléchargements

Altmetric

Partager

More