Skip to Main content Skip to Navigation
Journal articles

Kossel diffraction observed with X-ray color camera during PIXE of nano-scale periodic multilayer

Abstract : By combining Kossel diffraction with particle induced X-ray emission, we have developed a new methodology to analyze nano-scale thin films. We report the Kossel diffraction generated by irradiating Pd/Y based nano-scale periodic multilayers with 2 MeV protons. The intensity of characteristic Pd Lα X-ray emission is measured as a function of the detection angle (grazing exit). An oscillation of its intensity is observed when the detection angle varies around the Bragg angle, which corresponds to the energy of the emission and the period of the multilayer. Use of the X-ray color camera enables the whole setup to be fixed so that no angular scan is required, greatly simplifying the experimental condition. From the features of the Kossel curves, we are able to deduce that nitrided Pd/Y multilayers exhibit much less layer intermixing than the non-nitrided multilayers. The experimental results show that it is possible to distinguish by the shape of Kossel curves of multilayers with B 4 C barrier layers located in different interfaces. This demonstrates that Kossel diffraction is structural sensitive.
Document type :
Journal articles
Complete list of metadata

Cited literature [24 references]  Display  Hide  Download
Contributor : Gestionnaire Hal-Su Connect in order to contact the contributor
Submitted on : Friday, June 21, 2019 - 12:17:31 PM
Last modification on : Friday, January 14, 2022 - 9:38:05 AM


Files produced by the author(s)



Meiyi Wu, Karine Le Guen, Jean-Michel André, Philippe Jonnard, Ian Vickridge, et al.. Kossel diffraction observed with X-ray color camera during PIXE of nano-scale periodic multilayer. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2019, 450, pp.252-256. ⟨10.1016/j.nimb.2018.08.008⟩. ⟨hal-02162011⟩



Les métriques sont temporairement indisponibles