Atomic force microscope tip localization and tracking through deep learning based vision inside an electron microscope - Sorbonne Université Access content directly
Conference Papers Year : 2019
No file

Dates and versions

hal-02477481 , version 1 (13-02-2020)

Identifiers

Cite

Shuai Liang, Mokrane Boudaoud, Catherine Achard, Weibin Rong, Stéphane Régnier. Atomic force microscope tip localization and tracking through deep learning based vision inside an electron microscope. 2019 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS), Nov 2019, Macau, France. pp.2435-2440, ⟨10.1109/IROS40897.2019.8968567⟩. ⟨hal-02477481⟩
73 View
0 Download

Altmetric

Share

Gmail Facebook X LinkedIn More