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Atomic force microscope tip localization and tracking through deep learning based vision inside an electron microscope

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https://hal.sorbonne-universite.fr/hal-02477481
Contributor : Catherine Achard Connect in order to contact the contributor
Submitted on : Thursday, February 13, 2020 - 1:59:27 PM
Last modification on : Monday, October 11, 2021 - 10:04:31 AM

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Shuai Liang, Mokrane Boudaoud, Catherine Achard, Weibin Rong, Stéphane Régnier. Atomic force microscope tip localization and tracking through deep learning based vision inside an electron microscope. 2019 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS), Nov 2019, Macau, France. pp.2435-2440, ⟨10.1109/IROS40897.2019.8968567⟩. ⟨hal-02477481⟩

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