Physical properties obtained from measurement model analysis of impedance measurements
Abstract
The Voigt measurement model is regressed to synthetic data to demonstrate its ability to extract capacitance, ohmic resistance, and polarization resistance values from impedance data. The systems explored include a Randles circuit, films with exponential and power-law distributions of resistivity, systems exhibiting geometric capacitance, and systems showing geometry-induced frequency dispersion. The Voigt measurement model is also regressed to complex capacitance to identify the high-frequency limit in Cole–Cole plots. The measurement model is shown to provide a useful means to estimate properties characteristic of electrochemical systems.
Domains
Other| Origin | Files produced by the author(s) |
|---|